Micro- and Nanoscale Phenomena in Tribology

Author:   Yip-Wah Chung (Northwestern University, Evanston, Illinois, USA)
Publisher:   Taylor & Francis Ltd
ISBN:  

9781138072350


Pages:   222
Publication Date:   29 March 2017
Format:   Paperback
Availability:   In Print   Availability explained
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Micro- and Nanoscale Phenomena in Tribology


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Author:   Yip-Wah Chung (Northwestern University, Evanston, Illinois, USA)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.317kg
ISBN:  

9781138072350


ISBN 10:   1138072354
Pages:   222
Publication Date:   29 March 2017
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Yip-Wah Chung is a professor of materials science and engineering and mechanical engineering at Northwestern University. A fellow of ASM International, AVS, and STLE, Dr. Chung has received numerous honors, including the Ralph A. Teetor Engineering Educator Award from SAE, the Innovative Research Award and Best Paper Award from the ASME Tribology Division, and the Bronze Bauhinia Star from the Hong Kong Special Administrative Government. He earned a Ph.D. in physics from the University of California, Berkeley. His research interests encompass surface science, tribology, thin films, and alloy design.

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