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Author:   Jens-boie Suck (Technische Univ Chemnitz, Germany) ,  Christian Riekel (Esrf, France) ,  D Raoux (Cnrs, France) ,  P Chieux (Ill, France)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789810214630

ISBN 10:   9810214634
Pages:   260
Publication Date:   01 August 1993
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

An introduction to partial structure factors in the Nineties, P.A. Egelstaff; neutron contrast techniques applied to oxide glasses, P.H Gaskell; partial structure factors and orientational correlations in liquid Hl, C. Andreani et al; partial structure factors of weakly charged ions in solution, P. Calmettes et al; anomalous neutron diffraction studies of disordered materials, R. Sinclair; differential and partial structure factors by X-ray anomalous wide angle scattering, D. Raoux; a first level package of computer programs for anomalous X-ray data treatment, G. Navarra et al; some simple approaches to partial atomic correlation information from X-ray and neutron scattering; results used in investigation into phosphate glasses, U. Hoppe; reverse Monte Carlo methods for the determination of partial structure factors, R.L. McGreevy; RMC experimentation on metal-metal amorphous alloys, M. Bionducci et al; notes on the X-ray and neutron scattering nomencalture, P.A. Egelstaff. (Part contents).

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