Overview

"The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec­ tion with the others has brought a new impetus to both the funda­ mental and the applied aspects of materials science. A summer school on ""Material Characterization Using Ion Beams"" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu­ siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an ""institution"" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976."

Full Product Details

Author:   J. Thomas
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1978
Volume:   28
Dimensions:   Width: 17.00cm , Height: 2.70cm , Length: 24.40cm
Weight:   0.914kg
ISBN:  

9781468408584

ISBN 10:   1468408585
Pages:   517
Publication Date:   25 November 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
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Table of Contents

I Ion Beams: Production and Interaction with Matter.- Energy Loss of Charged Particles.- Some General Considerations of Ion Beam Production and Manipulation.- II Surface Studies: keV Range Ions.- Applications of Low-Energy Ion Scattering.- Ion Beam Induced Light Emission: Mechanisms and Analytical Applications.- Complementary Analysis Techniques: AES, ESCA.- III In-Depth Analysis.- Fundamental Aspects of Ion Microanalysis.- Ion Induced X-rays: General Description.- The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials.- Backscattering of Ions With Intermediate Energies.- Backscattering Analysis With MeV 4He Ions.- Microanalysis by Direct Observation of Nuclear Reactions.- IV Solid State Studies Using Channeling Effects.- Channeling: General Description.- Flux Peaking — Lattice Location.- Analysis of Defects by Channeling.- Application of MeV Ion Channeling to Surface Studies.- General Conclusions.- General Conclusions.- Participants.

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