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OverviewA collection of 43 papers on machine vision systems for inspection and metrology. Topics covered include the systems themselves, components within the systems and applications for them. Full Product DetailsAuthor: Batchelor , etc. , John W. Miller , Susan S. SolomonPublisher: SPIE Press Imprint: SPIE Press Volume: v. 3521 ISBN: 9780819429827ISBN 10: 0819429821 Pages: 398 Publication Date: 31 May 1999 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: To order Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |