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OverviewThis book describes the development of a new low-cost medium wavelength IR (MWIR) monolithic imager technology for high-speed uncooled industrial applications. It takes the baton on the latest technological advances in the field of vapor phase deposition (VPD) PbSe-based MWIR detection accomplished by the industrial partner NIT S.L., adding fundamental knowledge on the investigation of novel VLSI analog and mixed-signal design techniques at circuit and system levels for the development of the readout integrated device attached to the detector. In order to fulfill the operational requirements of VPD PbSe, this work proposes null inter-pixel crosstalk vision sensor architectures based on a digital-only focal plane array (FPA) of configurable pixel sensors. Each digital pixel sensor (DPS) cell is equipped with fast communication modules, self-biasing, offset cancellation, analog-to-digital converter (ADC) and fixed patternnoise (FPN) correction. In-pixel power consumption is minimized by the use of comprehensive MOSFET subthreshold operation. Full Product DetailsAuthor: Josep Maria MargaritPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: Softcover reprint of the original 1st ed. 2017 Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 0.454kg ISBN: 9783319842851ISBN 10: 3319842854 Pages: 173 Publication Date: 07 July 2018 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Frame-Based Smart IR Imagers.- Frame-Free Compact-Pitch IR Imagers.- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies.- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies.- Conclusions.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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