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OverviewWith a tutorial approach, this book covers the most important aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures located close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered intensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedicated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monitoring and detection of surface contamination by particles, optical communications, particle sizing and others. Full Product DetailsAuthor: Fernando Moreno , Francisco Gonzales , Universidad De Cantabria , Fernando MorenoPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Volume: v. 534 Weight: 0.567kg ISBN: 9783540669371ISBN 10: 354066937 Pages: 312 Publication Date: 15 March 2000 Audience: College/higher education , General/trade , Postgraduate, Research & Scholarly , General Format: Hardback Publisher's Status: Active Availability: Temporarily unavailable The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |