Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Author:   Stefan Rein
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of hardcover 1st ed. 2005
Volume:   85
ISBN:  

9783642064531


Pages:   492
Publication Date:   19 October 2010
Format:   Paperback
Availability:   Out of stock   Availability explained
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications


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Author:   Stefan Rein
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of hardcover 1st ed. 2005
Volume:   85
Dimensions:   Width: 15.50cm , Height: 2.60cm , Length: 23.50cm
Weight:   0.874kg
ISBN:  

9783642064531


ISBN 10:   3642064531
Pages:   492
Publication Date:   19 October 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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"10/99 ""Gustav-Mie-Preis"" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg 09/99 - 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz: ""Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications"" (overall grade: summa cum laude) 08/95 - 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell characterization 12/98 - 08/99 Research assistant at Fraunhofer ISE 1. in the department of solar cells - materials - technology 2. in the department of thermal optical systems 06/04 - today Research assistant at Fraunhofer ISE"

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