Lifetime Reliability-aware Design of Integrated Circuits

Author:   Mohsen Raji ,  Behnam Ghavami
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2023
ISBN:  

9783031153471


Pages:   107
Publication Date:   18 November 2023
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Lifetime Reliability-aware Design of Integrated Circuits


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Author:   Mohsen Raji ,  Behnam Ghavami
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2023
Weight:   0.201kg
ISBN:  

9783031153471


ISBN 10:   3031153472
Pages:   107
Publication Date:   18 November 2023
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a faculty member in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.   Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently an Associate Professor. He teaches courses in design and test of digital systems, computer architecture, embedded processor design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, computer architecture, statistical analysis, robust logic designs, and embedded processors. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA in automotive industry.

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