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Overview"""Jeff Wall: Exposure"" introduces four new large-scale black-and-white photographs by the Canadian artist Jeff Wall. Presented publicly for the first time in an accompanying special exhibition at the Deutsche Guggenheim in Berlin, this new work is shown alongside earlier pieces both black-and-white photographs as well as transparencies mounted in lightboxes to create an ensemble that resonates formally and aesthetically. This focused catalogue, with essays by Guggenheim Museum Curators of Photography Jennifer Blessing and Katrin Blum, will aptly demonstrate Walls continuing interrogation of the history of photographic representation, here specifically the legacies of documentary photography and neo-realist film." Full Product DetailsAuthor: Jennifer Blessing , Katrin BlumPublisher: Guggenheim Museum Publications,U.S. Imprint: Guggenheim Museum Publications,U.S. Edition: English ed. Dimensions: Width: 25.60cm , Height: 0.70cm , Length: 30.40cm Weight: 0.470kg ISBN: 9780892073696ISBN 10: 0892073691 Pages: 60 Publication Date: 01 February 2008 Audience: General/trade , General Format: Paperback Publisher's Status: Out of Print Availability: Out of stock  Table of ContentsReviewsNew York: The Museum of Modern Art, 2/25/07-5/14/07 San Francisco: Museum of Modern Art, Fall 2007 New York: The Museum of Modern Art, 2/25/07-5/14/07 New York: The Museum of Modern Art, 2/25/07-5/14/07 San Francisco: Museum of Modern Art, Fall 2007 Author InformationJennifer Blessing and Katrin Blum are both Curators in the Department of Photography at the Guggenheim Museum. Tab Content 6Author Website:Countries AvailableAll regions |
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