Interferogram Analysis For Optical Testing

Author:   Zacarias Malacara ,  Manuel Servín ,  Daniel Malacara
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9780367393199


Pages:   568
Publication Date:   19 September 2019
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Interferogram Analysis For Optical Testing


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Overview

In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.

Full Product Details

Author:   Zacarias Malacara ,  Manuel Servín ,  Daniel Malacara
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   0.453kg
ISBN:  

9780367393199


ISBN 10:   0367393190
Pages:   568
Publication Date:   19 September 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

About the Series. Preface. Review and Comparison of Main Interferometric Systems. Fourier Theory Review. Digital Image Processing. Fringe Contouring and Polynomial Fitting. Periodic Signal Phase Detection and Algorithm Analysis. Phase Shifting Algorithms. Phase Shifting Interferometry: Practical Considerations. Spatial Linear and Circular Carrier Analysis. Interferogram Analysis with Moiré Methods. Interferogram Analysis Without Carrier. Phase Unwrapping. Wavefront Curvature Sensing.

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Malacara, Zacarias; Servín, Manuel

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