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OverviewFull Product DetailsAuthor: David C. JoyPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2013 ed. Dimensions: Width: 15.50cm , Height: 0.80cm , Length: 23.50cm Weight: 1.372kg ISBN: 9781461486596ISBN 10: 1461486599 Pages: 64 Publication Date: 14 September 2013 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsChapter 1: Introduction to Helium Ion Microscopy.- Chapter 2: Microscopy with Ions - A brief history.- Chapter 3: Operating the Helium Ion Microscope.- Chapter 4: Ion –Solid Interactions and Image Formation.- Chapter 5: Charging and Damage.- Chapter 6: Microanalysis with the HIM.- Chapter 7: Ion Generated Damage.- Chapter 8: Working with other Ion beams.- Chapter 9: Patterning and Nanofabrication.- Conclusion.- Bibliography.- Appendix: iSE Yields, and IONiSE parameters for He+ excitation of Elements and Compounds.- Index.ReviewsFrom the reviews: Helium Ion Microscopy, Principles and Applications, is a compact volume of 64 pages, and is useful to anyone wishing fundamental knowledge on this topic. ... There are many features of this book that make it a useful resource for both the beginning and advanced microscopist. ... this book provides a novice researcher an initial resource to determine if this methodology is useful to their particular area and to determine what trade-offs are necessary. (Michael T. Postek, Microscopy and Microanalysis, Vol. 20 (2), 2014) From the reviews: Helium Ion Microscopy, Principles and Applications, is a compact volume of 64 pages, and is useful to anyone wishing fundamental knowledge on this topic. ... There are many features of this book that make it a useful resource for both the beginning and advanced microscopist. ... this book provides a novice researcher an initial resource to determine if this methodology is useful to their particular area and to determine what trade-offs are necessary. (Michael T. Postek, Microscopy and Microanalysis, Vol. 20 (2), 2014) Author InformationTab Content 6Author Website:Countries AvailableAll regions |
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