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OverviewFull Product DetailsAuthor: Patrick EchlinPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of hardcover 1st ed. 2009 Dimensions: Width: 17.80cm , Height: 1.80cm , Length: 25.40cm Weight: 0.655kg ISBN: 9781441946744ISBN 10: 1441946748 Pages: 332 Publication Date: 23 November 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Awaiting stock  The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you. Table of ContentsSample Collection and Selection.- Sample Preparation Tools.- Sample Support.- Sample Embedding ?and Mounting.- Sample Exposure.- Sample Dehydration.- Sample Stabilization for Imaging in the SEM.- Sample Stabilization to Preserve Chemical Identity.- Sample Cleaning.- Sample Surface Charge Elimination.- Sample Artifacts and Damage.- Additional Sources of Information.ReviewsThis handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential of the SEM be realized. -- Iolo ap Gwynn, Microscopy and Microanalysis (2010) This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential of the SEM be realized. -- Iolo ap Gwynn, Microscopy and Microanalysis (2010) Author InformationPatrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001. Tab Content 6Author Website:Countries AvailableAll regions |
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