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OverviewFull Product DetailsAuthor: R. K. Willardson (WILLARDSON CONSULTING SPOKANE, WASHINGTON) , Eicke R. Weber (Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany) , John C. Bean (University of Virginia, Charlottesville) , Robert Hull (University of Virginia, Charlottesville)Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Volume: v. 56 Dimensions: Width: 15.20cm , Height: 3.30cm , Length: 22.90cm Weight: 0.890kg ISBN: 9780127521640ISBN 10: 012752164 Pages: 444 Publication Date: 09 November 1998 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: In Print  Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of ContentsJ.C. Bean, Growth Techniques and Procedures. R. Hull, Misfit Strain Accommodation in SiGe Heterostructures. M.J. Shaw and M. Jaros, Fundamental Physics of Strained Layer GeSi: Quo Vadis? F. Cerdeira, Optical Properties. S.A. Ringel and P.N. Grillot, Electronic Properties and Deep Levels in Germanium-Silicon. J.C. Campbell, Optical Applications. K. Eberl, K. Brunner, and O.G. Schmidt, Si1-yCy and Si1-x-yGexCy Alloy Layers. Subject Index.ReviewsAuthor InformationProf. Dr. Eicke R. Weber, Fraunhofer-Institut fur Solare Energiesysteme ISE, Freiburg, Germany Tab Content 6Author Website:Countries AvailableAll regions |
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