Frontiers in Optical Methods: Nano-Characterization and Coherent Control

Author:   Ken-ichi Shudo ,  Ikufumui Katayama ,  Shin-Ya Ohno
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2014 ed.
Volume:   180
ISBN:  

9783642405938


Pages:   228
Publication Date:   17 December 2013
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Frontiers in Optical Methods: Nano-Characterization and Coherent Control


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Overview

This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

Full Product Details

Author:   Ken-ichi Shudo ,  Ikufumui Katayama ,  Shin-Ya Ohno
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2014 ed.
Volume:   180
Dimensions:   Width: 15.50cm , Height: 1.80cm , Length: 23.50cm
Weight:   4.853kg
ISBN:  

9783642405938


ISBN 10:   3642405932
Pages:   228
Publication Date:   17 December 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.

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