Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification

Author:   Sam Mitchell
Publisher:   De Gruyter
ISBN:  

9783110996784


Pages:   232
Publication Date:   18 July 2022
Format:   Paperback
Availability:   In stock   Availability explained
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Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification


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Overview

It is widely believed in philosophy of science that nobody can claim that any verdict of science is forced upon us by the effects of a physical world upon our sense organs and instruments. The Quine-Duhem problem supposedly allows us to resist any conclusion. Views on language aside, Quine is supposed to have shown this decisively. But it is just false. In many scientific examples, there is simply no room to doubt that a particular hypothesis is responsible for a refutation or established by the observations. Fault Tracing shows how to play independently established hypotheses against each other to determine whether an arbitrary hypothesis needs to be altered in the light of (apparently) refuting evidence. It analyses real examples from natural science, as well as simpler cases. It argues that, when scientific theories have a structure that prevents them from using this method, the theory looks wrong, and is subject to serious criticism. This is a new, and potentially far-reaching, theory of empirical justification.

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Author:   Sam Mitchell
Publisher:   De Gruyter
Imprint:   De Gruyter
Weight:   0.503kg
ISBN:  

9783110996784


ISBN 10:   3110996782
Pages:   232
Publication Date:   18 July 2022
Audience:   Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Sam Mitchell, Mount Holyoke College, South Hadley, Massachusetts, USA.

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