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OverviewFull Product DetailsAuthor: E. Ajith Amerasekera (Texas Instruments Inc.) , Farid N. Najm (University of Illinois at Urbana-Champaign) , F. Najim , F. Najim (University of Illinois, Urbana-Champaign, USA)Publisher: John Wiley & Sons Inc Imprint: John Wiley & Sons Inc Edition: 2nd edition Dimensions: Width: 15.60cm , Height: 2.50cm , Length: 23.30cm Weight: 0.680kg ISBN: 9780471954828ISBN 10: 0471954829 Pages: 360 Publication Date: 20 June 1997 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationE. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Tab Content 6Author Website:Countries AvailableAll regions |
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