Exponential Fatigue Life Model for Single-Edge-Notched Beams

Author:   Avaya Kumar Baliarsingh ,  Debabrata Rath
Publisher:   LAP Lambert Academic Publishing
ISBN:  

9786209272837


Pages:   80
Publication Date:   30 November 2025
Format:   Paperback
Availability:   Available To Order   Availability explained
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Exponential Fatigue Life Model for Single-Edge-Notched Beams


Overview

This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.

Full Product Details

Author:   Avaya Kumar Baliarsingh ,  Debabrata Rath
Publisher:   LAP Lambert Academic Publishing
Imprint:   LAP Lambert Academic Publishing
Dimensions:   Width: 15.20cm , Height: 0.50cm , Length: 22.90cm
Weight:   0.118kg
ISBN:  

9786209272837


ISBN 10:   6209272835
Pages:   80
Publication Date:   30 November 2025
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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