Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability

Author:   Abdelkhalak El Hami (Institut National des Sciences Appliquees (INSA-Rouen), France) ,  Philippe Pougnet (Reliability Expert, Valeo, Paris, France)
Publisher:   ISTE Press Ltd - Elsevier Inc
Edition:   2nd edition
ISBN:  

9781785481895


Pages:   274
Publication Date:   15 November 2019
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability


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Overview

Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives.The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled.

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Author:   Abdelkhalak El Hami (Institut National des Sciences Appliquees (INSA-Rouen), France) ,  Philippe Pougnet (Reliability Expert, Valeo, Paris, France)
Publisher:   ISTE Press Ltd - Elsevier Inc
Imprint:   ISTE Press Ltd - Elsevier Inc
Edition:   2nd edition
Weight:   0.560kg
ISBN:  

9781785481895


ISBN 10:   1785481894
Pages:   274
Publication Date:   15 November 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

1. Reliability-Based Design Optimization 2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices 3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities 4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques 5. Characterization of Switching Transistors under Electrical Overvoltage Stresses 6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress 7. Internal Temperature Measurement of Electronic Components 8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide 9. Study of the Dynamic Contact Between Deformable Solids

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Author Information

Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid–structure interaction studies, reliability and optimization.

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