Overview

The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modelling from around the world to explore how to synergistically combine atomic scale characterisation and modelling to enhance the development of new materials.

Full Product Details

Author:   Anatoly Avilov ,  Sergei Dudarev ,  Laurence Marks
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 999
Dimensions:   Width: 16.20cm , Height: 2.00cm , Length: 23.40cm
Weight:   0.576kg
ISBN:  

9780735405196

ISBN 10:   0735405190
Pages:   308
Publication Date:   01 April 2008
Audience:   Professional and scholarly ,  College/higher education ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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