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Author:   John T.L. Thong
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1993 ed.
Dimensions:   Width: 17.80cm , Height: 3.20cm , Length: 25.40cm
Weight:   2.500kg
ISBN:  

9780306443602

ISBN 10:   0306443600
Pages:   462
Publication Date:   31 July 1993
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Background to Electron Beam Testing Technology.- I.- 1. Introduction.- 2. Principles and Applications.- II.- 3. Essential Electron Optics.- 4. Electron Beam Interaction with Specimen.- 5. Electron Spectrometers and Voltage Measurements.- 6. High-Speed Techniques.- 7. Picosecond Photoemission Probing.- 8. Signal and Image Processing.- III.- 9. System Integration.- 10. Practical Considerations in Electron Beam Testing.- 11. Industrial Case Studies.

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