Electron Beam Testing Technology
Author:   John T.L. Thong
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1993
ISBN:  

9781489915245


Pages:   462
Publication Date:   04 June 2013
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Electron Beam Testing Technology


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Author:   John T.L. Thong
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1993
Dimensions:   Width: 17.80cm , Height: 2.40cm , Length: 25.40cm
Weight:   0.905kg
ISBN:  

9781489915245


ISBN 10:   1489915249
Pages:   462
Publication Date:   04 June 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Background to Electron Beam Testing; W.C. Nixon. Introduction; J.T.L. Thong. Principles and Applications; J.T.L. Thong. Essential Electron Optics; A.R. Dinnis. Electron Beam Interaction with Specimen; K. Ura. Electron Spectrometers and Voltage Measurements; L. Dubbeldam. High Speed Techniques; J.T.L. Thong. Picosecond Photoemission Probing; H. Beha, R. Clauberg. Signal and Image Processing; F.M. Boland, E.R. Lynch. System Integration; M. Battù, et al. Practical Considerations in Electron Beam Testing; T.J. Aton. Industrial Case Studies; D.W. Ranasinghe, et al. Index.

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