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OverviewDigital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects. Full Product DetailsAuthor: Telman AlievPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of hardcover 1st ed. 2007 Volume: 2 Dimensions: Width: 15.50cm , Height: 1.20cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781441944108ISBN 10: 1441944109 Pages: 224 Publication Date: 24 November 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Out of print, replaced by POD We will order this item for you from a manufatured on demand supplier. Table of ContentsReviewsFrom the reviews: The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those in search of new application tools in quality engineering applied in a broad setting. ... In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011) From the reviews: The monograph builds on a long series of publications by the author over the last decade. ! monograph should benefit researchers and practicing engineers ! particularly those in search of new application tools in quality engineering applied in a broad setting. ! In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011) From the reviews: “The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011) Author InformationTab Content 6Author Website:Countries AvailableAll regions |