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OverviewWritten by an outstanding group of applied theoreticians with comprehensive expertise and a wide spectrum of international contacts headed by Prof. A. M. Gusak, this monograph coherently presents the approaches and results hitherto only available in various journal papers. A must-have for all those involved with the public or corporate science of nano systems, thin films and electrical engineering. Full Product DetailsAuthor: AM Gusak , T. V. Zaporozhets , Yu. O. Lyashenko , S. V. KornienkoPublisher: Wiley-VCH Verlag GmbH Imprint: Wiley-VCH Verlag GmbH Dimensions: Width: 18.40cm , Height: 3.10cm , Length: 24.30cm Weight: 1.200kg ISBN: 9783527408849ISBN 10: 3527408843 Pages: 498 Publication Date: 08 September 2010 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationHaving obtained his higher degrees at Moscow State University and Institute of Metallurgy of USSR's Academy of Sciences, lead author Professor Gusak now is Deputy president of Cherkasy National University of Ukraine. Awarded with a prize by the American Physical Society for his work, he was investigator several international teams and served on international advisory boards for major conferences in this field. Visits have taken him to prestigious institutions, e.g. Univ. of Goettingen (Germany), UCLA (USA), Nanyang Technological University (Singapore). The research of Professor Gusak and his co-workers focuses on modeling of electromigration, void migration and microstructure change in metals, metal junctions, and nano systems. Tab Content 6Author Website:Countries AvailableAll regions |
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