Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997

Author:   J. Doneker ,  I. Rechenberg
Publisher:   Taylor & Francis Ltd
Volume:   160
ISBN:  

9780750305006


Pages:   524
Publication Date:   01 January 1998
Format:   Hardback
Availability:   In Print   Availability explained
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997


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Author:   J. Doneker ,  I. Rechenberg
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   160
Dimensions:   Width: 15.60cm , Height: 3.00cm , Length: 23.40cm
Weight:   0.975kg
ISBN:  

9780750305006


ISBN 10:   0750305002
Pages:   524
Publication Date:   01 January 1998
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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listed in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database. in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database.


listed in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database. in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database.


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Doneker, J.

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