Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering

Author:   Helmut Dosch
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of the original 1st ed. 1992
Volume:   126
ISBN:  

9783662149751


Pages:   149
Publication Date:   03 October 2013
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering


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Overview

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

Full Product Details

Author:   Helmut Dosch
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 1992
Volume:   126
Dimensions:   Width: 15.50cm , Height: 0.80cm , Length: 23.50cm
Weight:   0.254kg
ISBN:  

9783662149751


ISBN 10:   3662149753
Pages:   149
Publication Date:   03 October 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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