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OverviewThis second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences. Full Product DetailsAuthor: Jan Toporski , Thomas Dieing , Olaf HollricherPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: 2nd ed. 2018 Volume: 66 Weight: 1.087kg ISBN: 9783319753782ISBN 10: 3319753789 Pages: 596 Publication Date: 16 March 2018 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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