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Author:   Rob A. Rutenbar (Carnegie Mellon University) ,  Georges G. E. Gielen (Kathilieke University, Leuven) ,  Brian A. Antao (Silicon Metrics Corporation, Austin, Texas)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-IEEE Press
Dimensions:   Width: 22.10cm , Height: 4.00cm , Length: 28.40cm
Weight:   1.957kg
ISBN:  

9780471227823

ISBN 10:   047122782
Pages:   768
Publication Date:   16 May 2002
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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ROB A. RUTENBAR, PhD, received his PhD in computer engineering from the University of Michigan, and subsequently joined the faculty of Carnegie Mellon University where he is currently the Stephen J. Jatras Professor of Electrical and Computer Engineering. GEORGES G. E. GIELEN, PhD, received his MSc and PhD degrees in electrical engineering from the Katholieke Universiteit Leuven, Belgium. After being a visiting lecturer at the Department of Electrical Engineering and Computer Science of the University of California, Berkeley, he became a faculty member at the ESAT-MICAS laboratory of the electrical engineering department of the Katholieke Universiteit Leuven where he is now a full-time professor. BRIAN A. ANTAO, PhD, received his PhD in electrical engineering from Vanderbilt University. He is currently working with Silicon Metrics Corporation in Austin, Texas, developing advanced modeling solutions for Very Deep Sub-Micron (VDSM) characterization tools.

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