Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale

Author:   R. Rosei
Publisher:   Springer
Edition:   Softcover reprint of the original 1st ed. 1997
Volume:   333
ISBN:  

9789401064149


Pages:   132
Publication Date:   15 October 2012
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $142.29 Quantity:  
Add to Cart

Share |

Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale


Add your own review!

Overview

An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis. The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.

Full Product Details

Author:   R. Rosei
Publisher:   Springer
Imprint:   Springer
Edition:   Softcover reprint of the original 1st ed. 1997
Volume:   333
Dimensions:   Width: 16.00cm , Height: 0.80cm , Length: 24.00cm
Weight:   0.249kg
ISBN:  

9789401064149


ISBN 10:   9401064148
Pages:   132
Publication Date:   15 October 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

- Surface state electrons: transport through dangling bonds on Silicon, and scattering and confinement on metals.- - SFFM and SNOM of heterogeneous materials-.- - Synchrotron radiation spectromicroscopy: opportunities, limitations and data taking strategies.- - Scanning spectro-Microscopy with 250 to 800 eV X-rays-.- - Recent advances in LEEM/PEEM for structural and chemical analysis.- - Spectromicroscopy: some developments at BESSY.- - Shedding light on surface reactions PEEM, EMSI and RAM probed chemistry on solid surfaces.- - Subject Index.

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

Aorrng

Shopping Cart
Your cart is empty
Shopping cart
Mailing List