Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Author:   Sleiman Bou-Sleiman ,  Mohammed Ismail
Publisher:   Springer-Verlag New York Inc.
Edition:   2012
ISBN:  

9781441995476


Pages:   89
Publication Date:   22 September 2011
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs


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Overview

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

Full Product Details

Author:   Sleiman Bou-Sleiman ,  Mohammed Ismail
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2012
Dimensions:   Width: 15.50cm , Height: 0.50cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9781441995476


ISBN 10:   1441995471
Pages:   89
Publication Date:   22 September 2011
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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