Biotic Stress and Yield Loss

Author:   Robert K.D. Peterson (Montana State University) ,  Leon G. Higley (University of Nebraska) ,  Scott H. Hutchins ,  Leon G. Higley (University of Nebraska University of Nebraska, Lincoln, Nebraska, USA University of Mebraska University of Nebraska, Lincoln, USA)
Publisher:   Taylor & Francis Inc
ISBN:  

9780849311451


Pages:   276
Publication Date:   28 December 2000
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Biotic Stress and Yield Loss


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Overview

Understanding biotic stress and plant yield allows for the practical development of economic decision making, an instrumental part of Integrated Pest Management. And further, the impact of biotic injury on plant yield bears directly on the basic biological questions of population dynamics, life history strategies, community structure, plant-stressor coevolution, and ecosystem nutrient cycling. Biotic Stress and Yield Loss is a comprehensive review of the latest conclusions of yield loss in entomology, weed science, and plant pathology, combining state-of-the-art theory with successful applications. This book is unique in that it is the first to cover all biotic stressors, insects, weeds, and plant pathogens, and their impact on plant yield and fitness. It focuses on current knowledge of yield and fitness loss in both natural and agricultural ecosystems and on a physiologically based approach to provide a common basis for considering and discussing biotic stress. By considering biotic stress within the context of plant ecophysiology, Biotic Stress and Yield Loss attempts to elevate knowledge of biotic stress to the same level as abiotic stress and makes an argument for integrating the two types of stress.

Full Product Details

Author:   Robert K.D. Peterson (Montana State University) ,  Leon G. Higley (University of Nebraska) ,  Scott H. Hutchins ,  Leon G. Higley (University of Nebraska University of Nebraska, Lincoln, Nebraska, USA University of Mebraska University of Nebraska, Lincoln, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 15.60cm , Height: 2.00cm , Length: 23.40cm
Weight:   0.670kg
ISBN:  

9780849311451


ISBN 10:   0849311454
Pages:   276
Publication Date:   28 December 2000
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Foreword. Preface. Illuminating the Black Box: The Relationship between Injury and Yield. Yield Loss and Insect Management. Techniques for Evaluating Yield Loss from Insects. Phenological Disruption and Yield Loss from Insects. Photosynthesis, Yield Loss, and Injury Guilds. The Influence of Cultivar and Plant Architecture on Yield Loss. Drought Stress, Insects, and Yield Loss. The Impact of Herbivory on Plants: Yield, Fitness, and Population Dynamics. Contrasting Plant Responses to Herbivory in Wild and Domesticated Habitats. Crop Disease and Yield Loss. Quantifying Crop Yield Response to Weed Populations: Applications and Limitations. Mechanisms of Crop Loss Due to Weed Competition. Index

Reviews

Biotic Stress and Yield Loss is an indispensable resource for understanding the complex responses of plants to the attack of pests. Theoreticians and practitioners alike can rely on this work as a well-written and comprehensive reference on the topic. --Larry P. Pedigo A comprehensive review of plant yield loss in entomology, weed science, and plant pathology, covering both theory and applications. -Book News, March 2001 Promo Copy


"""Biotic Stress and Yield Loss is an indispensable resource for understanding the complex responses of plants to the attack of pests. Theoreticians and practitioners alike can rely on this work as a well-written and comprehensive reference on the topic."" --Larry P. Pedigo ""A comprehensive review of plant yield loss in entomology, weed science, and plant pathology, covering both theory and applications."" -Book News, March 2001 Promo Copy"


Author Information

Robert K.D. Peterson, Leon G. Higley

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