Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Author:   W Czanderna Alvin
Publisher:   Springer
ISBN:  

9781280204951


Pages:   430
Publication Date:   01 January 1998
Format:   Undefined
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $425.04 Quantity:  
Add to Cart

Share |

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis


Add your own review!

Overview

This introductory text describes the principles, techniques, and methods vital for efficient surface analysis.

Full Product Details

Author:   W Czanderna Alvin
Publisher:   Springer
Imprint:   Springer
ISBN:  

9781280204951


ISBN 10:   1280204958
Pages:   430
Publication Date:   01 January 1998
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

Aorrng

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now