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OverviewAtom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Full Product DetailsAuthor: Baptiste Gault , Michael P. Moody , Julie M. Cairney , Simon P. RingerPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2012 ed. Volume: 160 Dimensions: Width: 15.50cm , Height: 2.20cm , Length: 23.50cm Weight: 0.640kg ISBN: 9781489989390ISBN 10: 1489989390 Pages: 396 Publication Date: 11 June 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsPreface.- Acknowledgements.- List of Acronyms and Abbreviations.- List of Terms.- List of Non-SI Units and Constant Values.- PART I Fundamentals.- 1. Introduction.- 2. Field Ion Microscopy.- 3 From Field Desorption Microscopy to Atom Probe Tomography.- Part II Practical aspects.- 4. Specimen Preparation.- 5. Experimental protocols in Field Ion Microscopy.- 6. Experimental protocols.- 7. Tomographic reconstruction.- PART III Applying atom probe techniques for materials science.- 8. Analysis techniques for atom probe tomography.- 9. Atom probe microscopy and materials science.- Appendices.ReviewsAtom Probe Microscopy ... provides a much needed update on the topic and introduces the broader scientific community to this developing technique. ... this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory. (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015) “Atom Probe Microscopy … provides a much needed update on the topic and introduces the broader scientific community to this developing technique. … this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory.” (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015) Author InformationTab Content 6Author Website:Countries AvailableAll regions |
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