Overview

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Full Product Details

Author:   Bharat Bhushan ,  Harald Fuchs
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of hardcover 1st ed. 2006
Dimensions:   Width: 15.50cm , Height: 2.30cm , Length: 23.50cm
Weight:   0.706kg
ISBN:  

9783642065699

ISBN 10:   3642065694
Pages:   420
Publication Date:   12 February 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock  
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Table of Contents

Higher Harmonics in Dynamic Atomic Force Microscopy.- Atomic Force Acoustic Microscopy.- Scanning Ion Conductance Microscopy.- Spin-Polarized Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy.- Sensor Technology for Scanning Probe Microscopy and New Applications.- Quantitative Nanomechanical Measurements in Biology.- Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale.- Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices.- Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures.- Focused Ion Beam as a Scanning Probe: Methods and Applications.

Reviews

From the reviews: The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ! As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability. (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)

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