Overview

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

Full Product Details

Author:   Wolfgang Braun
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 1999
Volume:   154
Dimensions:   Width: 15.50cm , Height: 1.30cm , Length: 23.50cm
Weight:   0.367kg
ISBN:  

9783662156148

ISBN 10:   3662156148
Pages:   220
Publication Date:   20 November 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Reviews

Anyone interested in L.-M. Peng's chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail... Ultramicroscopy, 2001/87

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