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OverviewFull Product DetailsAuthor: Subhash R. Lele , Joan T. RichtsmeierPublisher: Taylor & Francis Ltd Imprint: Chapman & Hall/CRC Weight: 0.453kg ISBN: 9780367397630ISBN 10: 0367397633 Pages: 324 Publication Date: 07 October 2019 Audience: College/higher education , Tertiary & Higher Education Format: Paperback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents"""Foundations of Morphometrics. Morphometric Data. Statistical Models and Inference for Landmark Coordinate Data. Comparison of Form. Studying Growth. Classification, Clustering, and Other Applications."ReviewsAuthor InformationLele, Subhash R.; Richtsmeier, Joan T. Tab Content 6Author Website:Countries AvailableAll regions |