Advances in X-Ray Analysis: Volume 27

Author:   Jerome B. Cohen ,  Jerome B Cohen
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1984
ISBN:  

9781461297130


Pages:   596
Publication Date:   02 October 2011
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Advances in X-Ray Analysis: Volume 27


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Overview

This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal­ lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre­ dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting of: O. P. Anderson, Colorado State University (ACA) , D. E. Leyden, Colorado State University (DC), R. D. Witters, Colorado School of Mines (ACA) and P. K. Predecki (DC). We take this opportunity to thank the committee members and the early planners for their vision, ingenuity and hard work without which the conference would not have materialized. There was no plenary session in 1983, instead a number of special sessions were organized and chaired by various individuals.

Full Product Details

Author:   Jerome B. Cohen ,  Jerome B Cohen
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1984
Dimensions:   Width: 17.80cm , Height: 3.10cm , Length: 25.40cm
Weight:   1.126kg
ISBN:  

9781461297130


ISBN 10:   1461297133
Pages:   596
Publication Date:   02 October 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

I. J. D. Hanawalt Award Session On Search/Match Methods.- II. X-Ray Strain and Stress Determination.- III. Position Sensitive Detectors and X-Ray Instrumentation.- IV. Quantitative Phase Analysis by XRD.- V. Other XRD Applications.- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- VII. Mathematical Models and Computer Applications in XRF.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- IX. Other XRF Applications.- Author Index.

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