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OverviewFull Product DetailsAuthor: John Banhart (Department of Materials Science, Hahn-Meitner-Institute, Berlin)Publisher: Oxford University Press Imprint: Oxford University Press Volume: 66 Dimensions: Width: 16.20cm , Height: 2.50cm , Length: 24.00cm Weight: 0.955kg ISBN: 9780199213245ISBN 10: 0199213240 Pages: 490 Publication Date: 20 March 2008 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: To order  Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us. Table of Contents1: Introduction 2: Some Mathematical Concepts for Tomographic Reconstruction 3: Visualisation, Processing and Analysis of Tomographic Data 4: Radiation Sources and Interaction of Radiation with Matter 5: Synchrotron X-ray Absorption Tomography 6: Phase Contrast and Holographic Tomography 7: Tomography using magnifying optics 8: Scanning Tomography 9: Three-dimensional X-ray Diffraction 10: Detectors for Synchrotron Tomography 11: Fundamentals of Electron Tomography 12: Applications of Electron Tomography 13: Neutron Absorption Tomography 14: Neutron Phase Contrast and Polarised Neutron Tomography 15: Neutron Refraction and Small-Angle Scattering Tomography Appendix A: Facilities for Tomography Appendix B: Examples on CDROMReviewsAuthor InformationJohn Banhart - Editor Professor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin 1984: Degree in Physics, University of Munich 1989: PhD in Physical Chemistry, University of Munich 1990: Postdoc at University of Vienna 1998: Habilitation (2nd PhD) in Solid State Physics, University of Bremen 1991-2001: Senior Scientist at Fraunhofer-Institute for Materials Research Bremen 2002: Current Position Tab Content 6Author Website:Countries AvailableAll regions |
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