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OverviewFull Product DetailsAuthor: Yosi Shacham-Diamand , Tetsuya Osaka , Madhav Datta , Takayuki OhbaPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2009 ed. Dimensions: Width: 15.50cm , Height: 3.40cm , Length: 23.50cm Weight: 1.120kg ISBN: 9780387958675ISBN 10: 0387958673 Pages: 552 Publication Date: 27 October 2009 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsChallenges in ULSI Interconnects - Introduction to the Book.- Technology Background.- MOS Device and Interconnects Scaling Physics.- Interconnects in ULSI Systems: Cu Interconnects Electrical Performance.- Electrodeposition.- Electrophoretic Deposition.- Wafer-Level 3D Integration for ULSI Interconnects.- Interconnect Materials.- Diffusion Barriers for Ultra-Large-Scale Integrated Copper Metallization.- Silicides.- Materials for ULSI metallization - Overview of Electrical Properties.- Low-? Materials and Development Trends.- Electrical and Mechanical Characteristics of Air-Bridge Cu Interconnects.- ALD Seed Layers for Plating and Electroless Plating.- Deposition Processes for ULSI Interconnects.- Electrochemical Processes for ULSI Interconnects.- Atomic Layer Deposition (ALD) Processes for ULSI Manufacturing.- Electroless Deposition Approaching the Molecular Scale.- Modeling.- Modeling Superconformal Electrodeposition Using an Open Source PDE Solver.- Electrochemical Process Integration.- to Electrochemical Process Integration for Cu Interconnects.- Damascene Concept and Process Steps.- Advanced BEOL Technology Overview.- Lithography for Cu Damascene Fabrication.- Physical Vapor Deposition Barriers for Cu metallization - PVD Barriers.- Low-k Dielectrics.- CMP for Cu Processing.- Electrochemical View of Copper Chemical-Mechanical Polishing (CMP).- Copper Post-CMP Cleaning.- Electrochemical Processes and Tools.- Electrochemical Processing Tools for Advanced Copper Interconnects: An Introduction.- Electrochemical Deposition Processes and Tools.- Electroless Deposition Processes and Tools.- Tools for Monitoring and Control of Bath Components.- Processes and Tools for Co Alloy Capping.- Advanced Planarization Techniques.- Metrology.- Integrated Metrology (IM) History at aGlance.- Thin Film Metrology - X-ray Methods.- Summary and Foresight.- Emerging Nanoscale Interconnect Processing Technologies: Fundamental and Practice.- Self-Assembly of Short Aromatic Peptides: From Amyloid Fibril Formation to Nanotechnology.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |