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OverviewThe methods used to digitize and reconstruct complex 3-D objects have evolved in recent years due to increasing attention from industry and research. 3-D models have applications in various domains, including reverse engineering, collaborative design, inspection, entertainment, virtual museums, medicine, geology and home shopping. 3-D Surface Geometry and Reconstruction: Developing Concepts and Applications provides developers and scholars with an extensive collection of research articles in the expanding field of 3-D reconstruction. This reference book investigates the concepts, methodologies, applications and recent developments in the field of 3-D reconstruction, making it a useful resource for students, researchers, academics, professionals and industry practitioners. Full Product DetailsAuthor: Umesh Chandra PatiPublisher: Idea Group,U.S. Imprint: Idea Group,U.S. ISBN: 9781466601154ISBN 10: 1466601159 Pages: 405 Publication Date: 29 February 2012 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Mixed media product Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationUmesh C. Pati is an Associate Professor in the Department of Electronics and Communication Engineering at National Institute of Technology, Rourkela, India. He received a B.E. in Electrical Engineering from Regional Engineering College (now National Institute of Technology), Rourkela and M.Tech. and Ph.D. in Electrical Engineering from Indian Institute of Technology, Kharagpur, India. His current research interests are in the areas of image processing, computer vision, signal processing, and instrumentation. He has published one book and more than 40 research papers in referred journals and conference proceedings. He has served as referee in different international journals and conferences. He is a member of IEEE. Tab Content 6Author Website:Countries AvailableAll regions |