CompTIA Security+ All-in-One Exam Guide, Second Edition (Exam SY0-201)

Author:   Gregory White ,  Wm. Arthur Conklin ,  Dwayne Williams ,  Roger Davis
Publisher:   McGraw-Hill Education - Europe
Edition:   2nd edition
ISBN:  

9780071601276


Pages:   672
Publication Date:   16 February 2009
Replaced By:   9780071771474
Format:   Mixed media product
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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CompTIA Security+ All-in-One Exam Guide, Second Edition (Exam SY0-201)


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Full Product Details

Author:   Gregory White ,  Wm. Arthur Conklin ,  Dwayne Williams ,  Roger Davis
Publisher:   McGraw-Hill Education - Europe
Imprint:   McGraw-Hill Professional
Edition:   2nd edition
Dimensions:   Width: 19.60cm , Height: 3.90cm , Length: 23.90cm
Weight:   1.302kg
ISBN:  

9780071601276


ISBN 10:   0071601279
Pages:   672
Publication Date:   16 February 2009
Audience:   Professional and scholarly ,  Professional & Vocational
Replaced By:   9780071771474
Format:   Mixed media product
Publisher's Status:   Out of Print
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

Part I: Security Concepts Chapter 1. General Security Concepts Chapter 2. Operational Organizational Security Chapter 3. Legal Issues, Privacy, and Ethics Part II: Cryptography and Applications Chapter 4. Cryptography Chapter 5. Public Key Infrastructure Chapter 6. Standards and Protocols Part III: Security in the Infrastructure Chapter 7. Physical Security Chapter 8. Infrastructure Security Chapter 9. Authentication and Remote Access Chapter 10. Wireless Security Part IV: Security in Transmissions Chapter 11. Intrusion Detection Systems Chapter 12. Security Baselines Chapter 13. Types of Attacks and Malicious Software Chapter 14. E-Mail and Instant Messaging Chapter 15. Web Components Part V: Operational Security Chapter 16. Disaster Recovery and Business Continuity Chapter 17. Risk Management Chapter 18. Change Management Chapter 19. Privilege Management Chapter 20. Computer Forensics Part VI: Appendixes Appendix A. About the CD Appendix B. OSI Model and Internet Protocols Glossary Index

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Author Information

Greg White (San Antonio, TX), Security+, CISSP, is an Associate Professor in the Department of Computer Science at the University of Texas at San Antonio. Dr. White is the Director of the Center for Infrastructure Assurance and Security at UTSA, and was the author of the first edition of the Security+ All-in-One Exam Guide from McGraw-Hill. Wm. Arthur Conklin (Houston, TX), Security+, CISSP, is an Assistant Professor in the Information and Logistics Technology department at the University of Houston. In addition to his PhD, Mr. Conklin has a MBA from UTSA, and two graduate degrees in Electrical Engineering from the Naval Postgraduate School in Monterey, California. Dr. Conklin's interests are information security, systems theory, and secure software design. Roger L. Davis is a Senior Internal Audit Manager at NuSkin Enterprises and is responsible for evaluating global business operations in over 35 countries. He is a retired Air Force Colonel with over 20 years of military and information security experience. Mr. Davis is a Certified Information Systems Security Professional (CISSP) and holds a Master's Degree in Computer Science from George Washington University. Chuck Cothren is a Research Scientist at University of Texas at San Antonio (UTSA) Center for Infrastructure Assurance and Security (CIAS) and currently serves on the Information Security Association's Alamo Chapter Board of Directors. Mr. Cothren has a wide array of security experience including performing controlled penetration testing, network security policies, computer intrusion forensics, and computer training. He is a Certified Information Systems Security Professional (CISSP) and has co-authored other McGraw-Hill/Osborne titles. Mr. Cothren holds a B.S. in Industrial Distribution from Texas A&M University.

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