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Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products... Read More >>
Systems are subject to faults in their components, affecting their overall behaviour. In a black-box system, such... Read More >>
Power electronics is a discipline spawned by real-life applications and evolving from the need to solve power conversion... Read More >>
This is the book version of a special issue of the International Journal of High Speed Electronics and Systems,... Read More >>
The handbook explains in plain terms why moldings shrink and warp, shows how additives and reinforcements change... Read More >>
This e-book addresses embedded passive technology. The number of surface mount passive components used in electronic... Read More >>
This book/CD-ROM package is the definitive reference to the benefits, pitfalls, set-up, troubleshooting, and repair... Read More >>
Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as... Read More >>
CTL is a language that is used to represent test information. The proposed standard IEEE 1450.6 namely the Core... Read More >>
Low-Power CMOS Design for Wireless Transceivers provides a comprehensive treatment of the challenges in low-power... Read More >>
Design of High-Performance CMOS Voltage-Controlled Oscillators presents a phase noise modeling framework for CMOS... Read More >>
Presents seven prototypes - two double-sampled S/H circuits, a time-interleaved ADC, an IF-sampling self-calibrated... Read More >>
System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working... Read More >>
Microelectromechanical systems (MEMS) refer to a collection of micro sensors and actuators, which can react to environmental... Read More >>
Develops the concepts of quantum theory for the solid state from basics to a level beyond broader texts in a single... Read More >>
The first in Delmar Learning's Herrick & Jacob Series, six tightly integrated electronics engineering technology... Read More >>
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years... Read More >>
