Yield and Variability Optimization of Integrated Circuits
Author:   Jian Cheng Zhang ,  M.A. Styblinski
Publisher:   Kluwer Academic Publishers
Edition:   1995 ed.
ISBN:  

9780792395515


Pages:   234
Publication Date:   28 February 1995
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Yield and Variability Optimization of Integrated Circuits


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Author:   Jian Cheng Zhang ,  M.A. Styblinski
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1995 ed.
Dimensions:   Width: 15.50cm , Height: 1.50cm , Length: 23.50cm
Weight:   1.200kg
ISBN:  

9780792395515


ISBN 10:   0792395514
Pages:   234
Publication Date:   28 February 1995
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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