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OverviewThis third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this. Full Product DetailsAuthor: Paul F Fewster (Panalytical Research, Uk)Publisher: World Scientific Publishing Co Pte Ltd Imprint: World Scientific Publishing Co Pte Ltd Edition: 3rd Revised edition Dimensions: Width: 15.50cm , Height: 3.00cm , Length: 23.10cm Weight: 0.862kg ISBN: 9789814436922ISBN 10: 9814436925 Pages: 512 Publication Date: 27 April 2015 Audience: College/higher education , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsX-ray Scattering; Semiconductor Analysis; X-ray Instrumentation; X-ray Theory; Structural Properties of Materials.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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