X-Ray Metrology in Semiconductor Manufacturing
Author:   D. Keith Bowen (Bede Plc, Durham, UK) ,  Brian K. Tanner (University of Durham, UK)
Publisher:   Taylor & Francis Inc
ISBN:  

9780849339288


Pages:   296
Publication Date:   24 January 2006
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $378.00 Quantity:  
Add to Cart

Share |

X-Ray Metrology in Semiconductor Manufacturing


Add your own review!

Overview

Full Product Details

Author:   D. Keith Bowen (Bede Plc, Durham, UK) ,  Brian K. Tanner (University of Durham, UK)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 15.60cm , Height: 2.00cm , Length: 23.40cm
Weight:   0.544kg
ISBN:  

9780849339288


ISBN 10:   0849339286
Pages:   296
Publication Date:   24 January 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Reviews

Author Information

D. Keith Bowen, Brian K. Tanner

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now