Wafer Level Reliability of Advanced CMOS Devices & Processes
Author:   Yi Zhao ,  Terence B Hook ,  Xinggong Wan
Publisher:   Nova Science Publishers Inc
ISBN:  

9781604567137


Pages:   195
Publication Date:   26 November 2008
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Wafer Level Reliability of Advanced CMOS Devices & Processes


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Author:   Yi Zhao ,  Terence B Hook ,  Xinggong Wan
Publisher:   Nova Science Publishers Inc
Imprint:   Nova Science Publishers Inc
Weight:   0.608kg
ISBN:  

9781604567137


ISBN 10:   1604567139
Pages:   195
Publication Date:   26 November 2008
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Introduction; Gate dielectric; Hot carrier effect; Electromigration; Plasma process induced damage; Reliability of high-k gate dielectrics; Index.

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