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Author:   Shichun Qu ,  Yong Liu
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2015
Weight:   5.772kg
ISBN:  

9781493954384

ISBN 10:   1493954385
Pages:   322
Publication Date:   23 August 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Chapter 1. Demand and Challenges for Wafer Level Analog and Power Packaging.- Chapter 2. Fan-In Analog Wafer Level Chip Scale Package.- Chapter 3. Fan-Out Analog Wafer Level Chip Scale Package.- Chapter 4. Wafer Level Analog Chip Scale Package Stackable Design.- Chapter 5. Wafer Level Discrete Power MOSFET Package Design.- Chapter 6. Wafer Level Packaging TSV/Stack die for Integration of Analog and Power Solution.- Chapter 7. Thermal Management, Design, Analysis for WLCSP.- Chapter 8. Electrical and Multi-Physics Simulations for Analog and Power WLCSP.- Chapter 9. WLCSP Typical Assembly Process.- Chapter 10. WLCSP Typical Reliability and Test.

Reviews

Wafer Level Chip-Scale Packaging by Qu, Shichun, Liu, Yong presents good technical insights of wafer-level chip scale packaging (WLCSP) technology, suitable for both industry and academic practitioners. ... It is a good reference to demonstrate the alternate wafer-level chip scale packaging, and can serve as a very informative technical reference. ... The book is valuable as a learning tool for WLCSP and its clear relevance to real-world industry practices make it useful for both students and reliability practitioners. (Chong Leong Gan and Uda Hashim, Microelectronics Reliability, August, 2015)

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