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OverviewFull Product DetailsAuthor: Stanley L. HurstPublisher: Institution of Engineering and Technology Imprint: Institution of Engineering and Technology Volume: v. 9 ISBN: 9780852969014ISBN 10: 0852969015 Pages: 552 Publication Date: 15 October 1997 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsChapter 1: Introduction Chapter 2: Faults in digital circuits Chapter 3: Digital test pattern generation Chapter 4: Signatures and self test Chapter 5: Structured design for testability (DFT) techniques Chapter 6: Testing of structured digital circuits and microprocessors Chapter 7: Analogue testing Chapter 8: Mixed analogue/digital system test Chapter 9: The economics of test and final overall summary AppendicesReviews'The book covers the important aspects of VLSI testing, introduces a significant number of testing methods and strategies and is a valuable book on VLSI testing.' * Measurement, Science & Technology * Author InformationStanley L. Hurst began his industrial career with Westinghouse Brake and Signal Company before leaving for academia in the 1960s. Initially with the Bristol College of Science and Technology and subsequently with the University of Bath, he specialised in digital electronic teaching and research, particularly in custom microelectronics and testing. In 1985 he was recruited by the Open University to produce educational material on these subjects for industry and continuing education courses. He is currently Academic Editor, Circuits and Systems, of the Microelectronics Journal. He holds the MSc(Eng) and PhD from the University of London, the DSc from the University of Bath, and is the author of some 50 papers and eight books in his subject area. Tab Content 6Author Website:Countries AvailableAll regions |
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