VLSI Test Symposium (VTS 2004)
Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
ISBN:  

9780769521343


Pages:   550
Publication Date:   01 January 2004
Format:   Paperback
Availability:   In stock   Availability explained
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VLSI Test Symposium (VTS 2004)


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Overview

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Full Product Details

Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
Imprint:   IEEE Computer Society Press,U.S.
ISBN:  

9780769521343


ISBN 10:   0769521347
Pages:   550
Publication Date:   01 January 2004
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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