VLSI Test Symposium (VTS 2003), 21st IEEE
Author:   IEEE
Publisher:   I.E.E.E.Press
ISBN:  

9780769519241


Pages:   492
Publication Date:   01 January 2003
Format:   Paperback
Availability:   In stock   Availability explained
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VLSI Test Symposium (VTS 2003), 21st IEEE


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Overview

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Full Product Details

Author:   IEEE
Publisher:   I.E.E.E.Press
Imprint:   I.E.E.E.Press
Weight:   1.043kg
ISBN:  

9780769519241


ISBN 10:   0769519245
Pages:   492
Publication Date:   01 January 2003
Audience:   General/trade ,  College/higher education ,  Professional and scholarly ,  General ,  Undergraduate
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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