Free Delivery Over $100
|
|
|||
|
||||
OverviewThis book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.. Lecture slides and exercise solutions for all chapters are now available.. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. Full Product DetailsAuthor: Laung-Terng Wang , Cheng-Wen Wu , Xiaoqing WenPublisher: Morgan Kaufmann Publishers Imprint: Morgan Kaufmann Publishers ISBN: 9781280966842ISBN 10: 128096684 Pages: 777 Publication Date: 01 January 2006 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||
